Evaluation Electronics for Metrological Applications
Evaluation Electronics for metrological applications offer numerous functions for measured data acquisition and statistical evaluation of measured values.
QUADRA-CHEK evaluation electronics for profile projectors, measuring microscopes, 2-D and video measuring machines as well as CMMs measure points on 2-D contours, depending on the version either automatically or manually by crosshairs, by optical edge detection or by video camera with real-time display of the live image and integrated image processing. For 3-D contours, such as planes, cylinders, cones and spheres, the measurement points are saved by probing with a touch probe.
In the optional CNC version, they also operate as full-fledged controls for axis positioning and can automatically execute measuring programs.
• Precise capturing of measured values, and spot-on positioning in metrology applications• 100 presets• Measurement series with min. and max. value recording• Recording of the difference between min. and max. values (range)• Data transfer—manually, continuously, or when triggered by a touch probe• User administration• Configurability of each axis for length or angle display
GC 2023GC 2093